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1

Designing 0.5 V 5-nm HP and 0.23 V 5-nm LP NC-FinFETs With Improved ${I}_{ \mathrm{\scriptscriptstyle OFF}}$ Sensitivity in Presence of Parasitic Capacitance

Agarwal, Harshit, Kushwaha, Pragya, Duarte, Juan Pablo, Lin, Yen-Kai, Sachid, Angada B., Chang, Huan-Lin, Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.43 MB

english, 2018

2

[IEEE 2018 IEEE International Solid - State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2018.2.11-2018.2.15)] 2018 IEEE International Solid - State Circuits Conference - (ISSCC) - A 65nm 1Mb nonvolatile computing-in-memory ReRAM macro with sub-16ns multiply-and-accumulate for binary DNN AI edge processors

Chen, Wei-Hao, Li, Kai-Xiang, Lin, Wei-Yu, Hsu, Kuo-Hsiang, Li, Pin-Yi, Yang, Cheng-Han, Xue, Cheng-Xin, Yang, En-Yu, Chen, Yen-Kai, Chang, Yun-Sheng, Hsu, Tzu-Hsiang, King, Ya-Chin, Lin, Chorng-Jung,

Year:

2018

Language:

english

File:

PDF, 2.04 MB

english, 2018

3

Effects of particle volume fraction on spray heat transfer performance of Al2O3–water nanofluid

Tong-Bou Chang, Siou-Ci Syu, Yen-Kai Yang

Journal:

International Journal of Heat and Mass Transfer

Year:

2012

Language:

english

File:

PDF, 1.62 MB

english, 2012

4

Heat transfer performance of jet impingement flow boiling using Al2O3-water nanofluid

Chang, Tong-Bou, Yang, Yen-Kai

Journal:

Journal of Mechanical Science and Technology

Year:

2014

Language:

english

File:

PDF, 764 KB

english, 2014

5

[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Modeling of GeOI and validation with Ge-CMOS inverter circuit using BSIM-IMG industry standard model

Agarwal, Harshit, Kushwaha, Pragya, Chauhan, Yogesh S., Khandelwal, Sourabh, Duarte, Juan P., Lin, Yen-Kai, Chang, Huan-Lin, Hu, Chenming, Wu, Heng, Ye, Peide D.

Year:

2016

Language:

english

File:

PDF, 1.49 MB

english, 2016

6

Effects of temperature, dust concentration, and filtration superficial velocity on the loading behavior and dust cakes of ceramic candle filters during hot gas filtration

Lin, Justin Chun-Te, Hsiao, Ta-Chih, Hsiau, Shu-San, Chen, Da-Ren, Chen, Yen-Kai, Huang, Sheng-Hsiu, Chen, Chih-Chieh, Chang, Moo-Been

Journal:

Separation and Purification Technology

Year:

2017

Language:

english

File:

PDF, 1.30 MB

english, 2017

7

[IEEE 2019 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Macau, Macao (2019.11.4-2019.11.6)] 2019 IEEE Asian Solid-State Circuits Conference (A-SSCC) - A 0.5V Real-Time Computational CMOS Image Sensor with Programmable Kernel for Always-On Feature Extraction

Hsu, Tzu-Hsiang, Chen, Yen-Kai, Wen, Tai-Hsing, Wei, Wei-Chen, Chen, Yi-Ren, Chang, Fu-Chun, Kim, Hyunjoon, Chen, Qian, Kim, Bongjin, Liu, Ren-Shuo, Lo, Chung-Chuan, Tang, Kea-Tiong, Chang, Meng-Fan,

Year:

2019

File:

PDF, 7.81 MB

2019

8

PSYCHOLOGY AND GLOBAL ENVIRONMENTAL PRIORITIES IN TAIWAN: A PSYCHOMETRIC COMPARISON OF TWO LEARNING MODELS

WILLIAM M. BOWEN, CHIEH-CHEN CHANG, YEN-KAI HUANG

Journal:

Journal of Environmental Psychology

Year:

1996

Language:

english

File:

PDF, 81 KB

english, 1996

9

Characterization of γS-Crystallin Isoforms from a Catfish: Evolutionary Comparison of Various γ-, γS-, and β-Crystallins

Shyh-Horng Chiou, Fu-Ming Pan, Hsuan-Wan Peng, Yen-Kai Chao, Wen-Chang Chang

Journal:

Biochemical and Biophysical Research Communications

Year:

1998

Language:

english

File:

PDF, 230 KB

english, 1998

10

Dissimilar permittivity and permeability sensitivities in nonlinear plasmons and spoof plasmons

Chang, Yen-Kai, Chang, Chih-Wei

Journal:

Year:

2014

Language:

english

File:

PDF, 472 KB

english, 2014

11

Universal scaling of plasmonic refractive index sensors

Chang, Yen-Kai, Lou, Zong-Xing, Chang, Kao-Der, Chang, Chih-Wei

Journal:

Year:

2013

Language:

english

File:

PDF, 1.57 MB

english, 2013

12

Universal scaling of plasmonic refractive index sensors: erratum

Chang, Yen-Kai, Lou, Zong-Xing, Chang, Kao-Der, Chang, Chih-Wei

Journal:

Year:

2013

Language:

english

File:

PDF, 618 KB

english, 2013

13

Modeling of Subsurface Leakage Current in Low Short Channel MOSFET at Accumulation Bias

Lin, Yen-Kai, Khandelwal, Sourabh, Medury, Aditya Sankar, Agarwal, Harshit, Chang, Huan-Lin, Chauhan, Yogesh Singh, Hu, Chenming

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.62 MB

english, 2016

14

[IEEE 2016 IEEE 83rd Vehicular Technology Conference (VTC Spring) - Nanjing, China (2016.5.15-2016.5.18)] 2016 IEEE 83rd Vehicular Technology Conference (VTC Spring) - Machine-Learning Indoor Localization with Access Point Selection and Signal Strength Reconstruction

Cheng, Yen-Kai, Chou, Hsin-Jui, Chang, Ronald Y.

Year:

2016

Language:

english

File:

PDF, 256 KB

english, 2016

15

[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Predictive effective mobility model for FDSOI transistors using technology parameters

Kushwaha, Pragya, Agarwal, Harshit, Chauhan, Yogesh S., Bhoir, Mandar, Mohapatra, Nihar R., Khandelwal, Sourabh, Duarte, Juan P., Lin, Yen-Kai, Chang, Huan-Lin, Hu, Chenming

Year:

2016

Language:

english

File:

PDF, 147 KB

english, 2016

16

A Predictive Tunnel FET Compact Model With Atomistic Simulation Validation

Lin, Yen-Kai, Khandelwal, Sourabh, Duarte, Juan Pablo, Chang, Huan-Lin, Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 2.12 MB

english, 2017

17

[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - Compact models of negative-capacitance FinFETs: Lumped and distributed charge models

Duarte, Juan P., Khandelwal, Sourabh, Khan, Asif I., Sachid, Angada, Lin, Yen-Kai, Chang, Huan-Lin, Salahuddin, Sayeef, Hu, Chenming

Year:

2016

Language:

english

File:

PDF, 1.78 MB

english, 2016

18

[IEEE 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2016.8.3-2016.8.5)] 2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Modeling of threshold voltage for operating point using industry standard BSIM-IMG model

Kushwaha, Pragya, Agarwal, Rahul, Agarwal, Harshit, Chauhan, Yogesh Singh, Khandelwal, Sourabh, Duarte, Juan P., Lin, Yen-Kai, Chang, Huan-Lin, Hu, Chenming

Year:

2016

Language:

english

File:

PDF, 224 KB

english, 2016

19

Compact Modeling Source-to-Drain Tunneling in Sub-10-nm GAA FinFET With Industry Standard Model

Lin, Yen-Kai, Duarte, Juan Pablo, Kushwaha, Pragya, Agarwal, Harshit, Chang, Huan-Lin, Sachid, Angada, Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.42 MB

english, 2017

20

Modeling of Back-Gate Effects on Gate-Induced Drain Leakage and Gate Currents in UTB SOI MOSFETs

Lin, Yen-Kai, Kushwaha, Pragya, Agarwal, Harshit, Chang, Huan-Lin, Duarte, Juan Pablo, Sachid, Angada B., Khandelwal, Sourabh, Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.68 MB

english, 2017

21

New Mobility Model for Accurate Modeling of Transconductance in FDSOI MOSFETs

Lin, Yen-Kai, Kushwaha, Pragya, Duarte, Juan Pablo, Chang, Huan-Lin, Agarwal, Harshit, Khandelwal, Sourabh, Sachid, Angada B., Harter, Michael, Watts, Josef, Chauhan, Yogesh Singh, Salahuddin, Sayeef,

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.10 MB

english, 2018

22

[IEEE GLOBECOM 2017 - 2017 IEEE Global Communications Conference - Singapore (2017.12.4-2017.12.8)] GLOBECOM 2017 - 2017 IEEE Global Communications Conference - Device-Free Indoor People Counting Using Wi-Fi Channel State Information for Internet of Things

Cheng, Yen-Kai, Chang, Ronald Y.

Year:

2017

Language:

english

File:

PDF, 1.74 MB

english, 2017

23

[IEEE 2017 IEEE 85th Vehicular Technology Conference (VTC Spring) - Sydney, NSW (2017.6.4-2017.6.7)] 2017 IEEE 85th Vehicular Technology Conference (VTC Spring) - Self-Sustainable Robotic Environment Discovery for Energy Harvesting Internet of Things

Cheng, Yen-Kai, Chang, Ronald Y.

Year:

2017

Language:

english

File:

PDF, 270 KB

english, 2017

24

Modeling of Advanced RF Bulk FinFETs

Kushwaha, Pragya, Agarwal, Harshit, Lin, Yen-Kai, Kao, Ming-Yen, Duarte, Juan-Pablo, Chang, Huan-Lin, Wong, Waisum, Fan, Jiewen, Xiayu,, Chauhan, Yogesh Singh, Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 847 KB

english, 2018

25

[IEEE 2017 IEEE 85th Vehicular Technology Conference (VTC Spring) - Sydney, NSW (2017.6.4-2017.6.7)] 2017 IEEE 85th Vehicular Technology Conference (VTC Spring) - A Comparative Study of Machine-Learning Indoor Localization Using FM and DVB-T Signals in Real Testbed Environments

Cheng, Yen-Kai, Chang, Ronald Y., Chen, Ling-Jyh

Year:

2017

Language:

english

File:

PDF, 1005 KB

english, 2017

26

Visible Light Responsive Photocatalyst Induces Progressive and Apical-Terminus Preferential Damages on Escherichia coli Surfaces

Liou, Je-Wen, Gu, Ming-Hui, Chen, Yen-Kai, Chen, Wen-Yi, Chen, Yi-Cheng, Tseng, Yao-Hsuan, Hung, Yu-Jiun, Chang, Hsin-Hou, Chakravortty, Dipshikha

Journal:

Year:

2011

Language:

english

File:

PDF, 1.96 MB

english, 2011

27

Variation Caused by Spatial Distribution of Dielectric and Ferroelectric Grains in a Negative Capacitance Field-Effect Transistor

Kao, Ming-Yen, Sachid, Angada B., Lin, Yen-Kai, Liao, Yu-Hung, Agarwal, Harshit, Kushwaha, Pragya, Duarte, Juan Pablo, Chang, Huan-Lin, Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.18 MB

english, 2018

28

[IEEE 2018 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2018.12.1-2018.12.5)] 2018 IEEE International Electron Devices Meeting (IEDM) - Effect of Polycrystallinity and Presence of Dielectric Phases on NC-FinFET Variability

Lin, Yen-Kai, Kao, Ming-Yen, Agarwal, Harshit, Liao, Yu-Hung, Kushwaha, Pragya, Chatterjee, Korok, Duarte, Juan Pablo, Chang, Huan-Lin, Salahuddin, Sayeef, Hu, Chenming

Year:

2018

File:

PDF, 6 KB

2018

29

[IEEE GLOBECOM 2018 - 2018 IEEE Global Communications Conference - Abu Dhabi, United Arab Emirates (2018.12.9-2018.12.13)] 2018 IEEE Global Communications Conference (GLOBECOM) - Device-Free Indoor Localization Using Wi-Fi Channel State Information for Internet of Things

Chang, Ronald Y., Liu, Shing-Jiuan, Cheng, Yen-Kai

Year:

2018

Language:

english

File:

PDF, 9 KB

english, 2018

30

Design Ideas for an Issue-Situation-Based Board Game Involving Multirole Scenarios

Cheng, Ping-Han, Yeh, Ting-Kuang, Chao, Yen-Kai, Lin, Jing, Chang, Chun-Yen

Journal:

Year:

2020

File:

PDF, 1.62 MB

2020

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